prikaz prve stranice dokumenta Susceptibility of integrated circuits to conducted electromagnetic interference
No public access
doctoral thesis
Susceptibility of integrated circuits to conducted electromagnetic interference
Zagreb: University of Zagreb, Faculty of Electrical Engineering and Computing, 2011. urn:nbn:hr:168:305390
Jović, Ognjen
University of Zagreb
Faculty of Electrical Engineering and Computing
Department of Electronics, Microelectronics, Computer and Intelligent Systems

Institutional repository: FER Repository

Cite this document

Jović, O. (2011). Susceptibility of integrated circuits to conducted electromagnetic interference (Doctoral thesis). Zagreb: University of Zagreb, Faculty of Electrical Engineering and Computing. Retrieved from https://urn.nsk.hr/urn:nbn:hr:168:305390

Jović, Ognjen. "Susceptibility of integrated circuits to conducted electromagnetic interference." Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, 2011. https://urn.nsk.hr/urn:nbn:hr:168:305390

Jović, Ognjen. "Susceptibility of integrated circuits to conducted electromagnetic interference." Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, 2011. https://urn.nsk.hr/urn:nbn:hr:168:305390

Jović, O. (2011). 'Susceptibility of integrated circuits to conducted electromagnetic interference', Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, accessed 26 December 2024, https://urn.nsk.hr/urn:nbn:hr:168:305390

Jović O. Susceptibility of integrated circuits to conducted electromagnetic interference [Doctoral thesis]. Zagreb: University of Zagreb, Faculty of Electrical Engineering and Computing; 2011 [cited 2024 December 26] Available at: https://urn.nsk.hr/urn:nbn:hr:168:305390

O. Jović, "Susceptibility of integrated circuits to conducted electromagnetic interference", Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, Zagreb, 2011. Available at: https://urn.nsk.hr/urn:nbn:hr:168:305390

Metadata
TitleSusceptibility of integrated circuits to conducted electromagnetic interference
Title (croatian)Osjetljivost integriranih sklopova na vođenu elektromagnetsku interferenciju
AuthorOgnjen Jović
MentorAdrijan Barić (mentor)
MentorWolfgang Wilkening (komentor)
strani drzavljanin: Nije dostupno
Committee memberŽeljko Butković (predsjednik povjerenstva)
Committee memberJuraj Bartolić (član povjerenstva)
Committee memberTomislav Švedek (član povjerenstva)
GranterUniversity of Zagreb
Faculty of Electrical Engineering and Computing
(Department of Electronics, Microelectronics, Computer and Intelligent Systems)
Zagreb
Defense date and country2011-12-19, Croatia
Scientific / art field,
discipline and subdiscipline		TECHNICAL SCIENCES
Electrical Engineering
Universal decimal classification
(UDC)		621.3 - Electrical engineering
Abstract
This thesis includes measurements and simulations to investigate the susceptibility of integrated circuits to conducted electromagnetic interference. Measurements are carried out according to direct power injection method (DPI). The investigation is focused on several basic circuits which are common in automotive industry: low and high voltage PMOS transistors, AB buffer, bandgap circuit and voltage regulator. Furthermore, this thesis explains analytically and experimentally the underlining effects caused by conducted electromagnetic interference and presents extraction methods to improve simulation models to achieve better susceptibility predictions. Additionally, simple but effective measures to increase the immunity of the circuits are presented. All test structures are processed in 0.35 μm smart power technology and modified to allow measurements on the wafer. The technology, measurement equipment and consulting of different experts was provided by Robert Bosch GmbH, Reutlingen, Germany. This thesis was a part of a European project “MEDEA +2A701 PARACHUTE”.
Abstract (croatian)
Polje istraživanja doktorske disertacije obuhvaca simulacije i mjerenje elektromagnetskog iminiteta integriranih sklopova na vodene elektromagnetske smetnje. Istražuje se osjetljivost osnovnih elektronickih elemenata i sklopova koji se koriste u automobilskoj elektronici. Rad ukljucuje verifikaciju simulacijskih modela, te razvoj simulacijske metode za predvidanje osjetljivosti el. sklopova na vodene elektromagnetske smetnje. Mjerenja se obavljaju u skladu s izravnom injekcijom snage (DPI metodom). Kako bi se uklonili utjecaji neželjenih efekata uzrokovanih žicama za povezivanje cipa i kucišta te vodova tiskane plocice, projektirane su specificne testne structure koje omogucuju direktno mjerenje na cipu. Osim toga u ovom se radu analiticki i eksperimentalno objašnjavaju efekti koji su uzrokovani vodenom elektromagnetskom smetnjom, prezentiraju se poboljšani modeli tranzistora i nova metodologija ekstrahiranja parametara tranzistora kako bi se dobila bolja predvidivost osjetljivosti integriranih sklopova na vodene elektromagnetske smetnje. Dodatno se prikazuju jednostave metode za poboljšanje imuniteta integriranih sklopova na vodene elektromagnetske smetnje. Sve testne strukture procesirane su u 0.35-µm-skoj smart power tehnologiji, što je moderna silicijska tehnologija koja se koristi u automobilskoj elektronici. Procesirani su nisko- i visoko- naponski PMOS tranzistori, pojacalo AB klase, referentni izvor napona i regulator napona. Proizvodnja silicijskih testnih struktura kao i dodatna oprema za mjerenje, simuliranje te konzultacije sa specijalistima iz pojedinih grana automobilske elektronike omoguceni su preko tvrtke Robert Bosch GmbH, Reutlingen, Njemacka. Istraživanje se provodilo u sklopu europskog projekta “MEDEA +2A701 PARACHUTE”.
Keywords
Keywords (croatian)
Languageenglish
URN:NBNurn:nbn:hr:168:305390
ProjectNumber: 036-0361621-1622
Title: Kvaliteta signala u integriranim sklopovima s mješovitim signalom
Leader: Adrijan Barić
Jurisdiction: Croatia
Funder: MZOS
Funding stream: ZP
Study programmeTitle: Doctoral study programme "Electrical Engineering and Computing"
Study programme type: university
Study level: postgraduate
Academic / professional title: doktor/doktorica znanosti, po-dručje tehničkih znanosti (doktor/doktorica znanosti, po-dručje tehničkih znanosti)
Catalog URLhttp://lib.fer.hr/cgi-bin/koha/opac-detail.pl?biblionumber=37170
Type of resourceText
Extent189 str ; 30 cm
File originBorn digital
Access conditionsClosed access
Terms of useLicence In copyright icon
Created on2020-09-04 12:38:50