Dataset: imaging_article_data.zip, 721.13 KB Access Condition: Open access Description: TOF-SIMS mass spectra and maps from the cited article (English)
Brajković, M., Bogdanović Radović, I., Barac, M., Cosic, D. D. & Siketić, Z. (2021). Imaging of Organic Samples with Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Capillary Microprobe [Data set]. doi:10.5281/zenodo.5970366
Brajković, Marko, et al. Imaging of Organic Samples with Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Capillary Microprobe. Institut Ruđer Bošković, 2021. 18 Nov 2024. doi:10.5281/zenodo.5970366
Brajković, Marko, Ivančica Bogdanović Radović, Marko Barac, Donny Domagoj Cosic, and Zdravko Siketić. 2021. Imaging of Organic Samples with Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Capillary Microprobe. Institut Ruđer Bošković. doi:10.5281/zenodo.5970366
Brajković, M., et al. 2021. Imaging of Organic Samples with Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Capillary Microprobe. Institut Ruđer Bošković. [Online]. [Accessed 18 November 2024]. Available from: https://doi.org/10.5281/zenodo.5970366
Brajković M, Bogdanović Radović I, Barac M, Cosic DD, Siketić Z. Imaging of Organic Samples with Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Capillary Microprobe. [Internet]. Institut Ruđer Bošković: Zagreb, HR; 2021, [cited 2024 November 18] Available from: https://doi.org/10.5281/zenodo.5970366
M. Brajković, I. Bogdanović Radović, M. Barac, D. D. Cosic and Z. Siketić, Imaging of Organic Samples with Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Capillary Microprobe, Institut Ruđer Bošković, 2021. Accessed on: Nov 18, 2024. Available: https://doi.org/10.5281/zenodo.5970366
Title (english)
Imaging of Organic Samples with Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Capillary Microprobe
Author
Marko Brajković Institut Ruđer Bošković Ruđer Bošković Institute
Marko Barac Institut Ruđer Bošković Ruđer Bošković Institute
Author
Donny Domagoj Cosic Institut Ruđer Bošković Ruđer Bošković Institute
Author
Zdravko Siketić Institut Ruđer Bošković Ruđer Bošković Institute
Scientific / art field, discipline and subdiscipline
NATURAL SCIENCES Physics Nuclear Physics
Abstract (english)
Time-of-flight Secondary Ion Mass Spectrometry (TOF SIMS) with MeV primary ions offers a fine balance between secondary ion yield for molecules in the mass range from 100 to 1000 Da and beam spot size, both of which are critical for imaging applications of organic samples. Using conically shaped glass capillaries with an exit diameter of a few micrometers, a high energy heavy primary beam can be collimated to less than 10 μm. In this work, imaging capabilities of such a setup are presented for some organic samples (leucine-evaporated mesh, fly wing section, ink deposited on paper). Lateral resolution measurement and molecular distributions of selected mass peaks are shown. The negative influence of the beam halo, an unavoidable characteristic of primary beam collimation with a conical capillary, is also discussed. A new start trigger for TOF measurements based on the detection of secondary electrons released by the primary ion is presented. This method is applicable for a continuous primary ion beam, and for thick targets that are not transparent to the primary ion beam. The solution preserves the good mass resolution of the thin target setup, where the detection of primary ions with a PIN diode is used for a start trigger, reduces the background, and enables a wide range of samples to be analyzed.
Number: IP-2016-06-1698 Title (croatian): Razvoj kapilarne mikroprobe za MeV SIMS s primjenom na analizu bioloških materijala Acronym: BioCapSIMS Leader: Ivančica Bogdanović Radović Jurisdiction: Croatia Funding stream: IP
Project
Number: 824096 Title (english): Research And Development with Ion Beams – Advancing Technology in Europe Acronym: RADIATE Jurisdiction: eu Funding stream: H2020
Project
Number: KK.01.1.1.01.0001 Title (croatian): Potpora vrhunskim istraživanjima Centra izvrsnosti za napredne materijale i senzore