Šestović, D., Marušić, L. & Šunjić, M. (1997). Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions. Physical review B: Condensed matter and materials physics, 55. (3), 1741-1747. Retrieved from https://urn.nsk.hr/urn:nbn:hr:217:930128
Šestović, Dragan, et al. "Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions." Physical review B: Condensed matter and materials physics, vol. 55, no. 3, 1997, pp. 1741-1747. https://urn.nsk.hr/urn:nbn:hr:217:930128
Šestović, Dragan, Leonardo Marušić and Marijan Šunjić. "Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions." Physical review B: Condensed matter and materials physics 55, no. 3 (1997): 1741-1747. https://urn.nsk.hr/urn:nbn:hr:217:930128
Šestović, D., Marušić, L. and Šunjić, M. (1997) 'Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions', Physical review B: Condensed matter and materials physics, 55(3), pp. 1741-1747. Available at: https://urn.nsk.hr/urn:nbn:hr:217:930128 (Accessed 26 August 2024)
Šestović D, Marušić L, Šunjić M. Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions. Physical review B: Condensed matter and materials physics [Internet]. 1997 [cited 2024 August 26];55(3):1741-1747. Available at: https://urn.nsk.hr/urn:nbn:hr:217:930128
D. Šestović, L. Marušić and M. Šunjić, "Dynamical screening in the scanning tunneling microscope and metal-insulator-metal junctions", Physical review B: Condensed matter and materials physics, vol. 55, no. 3, pp. 1741-1747, 1997. [Online]. Available at: https://urn.nsk.hr/urn:nbn:hr:217:930128. [Accessed: 26 August 2024]