Đerđ, I., Tonejc, A., Tonejc, A. & Radić, N. (2006). On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A, 15. (1), 35-50. Retrieved from https://urn.nsk.hr/urn:nbn:hr:217:428918
Đerđ, Igor, et al. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A, vol. 15, no. 1, 2006, pp. 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918
Đerđ, Igor, Anđelka Tonejc, Antun Tonejc and Nikola Radić. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A 15, no. 1 (2006): 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918
Đerđ, I., et al. (2006) 'On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films', Fizika A, 15(1), pp. 35-50. Available at: https://urn.nsk.hr/urn:nbn:hr:217:428918 (Accessed 08 March 2025)
Đerđ I, Tonejc A, Tonejc A, Radić N. On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A [Internet]. 2006 [cited 2025 March 08];15(1):35-50. Available at: https://urn.nsk.hr/urn:nbn:hr:217:428918
I. Đerđ, A. Tonejc, A. Tonejc and N. Radić, "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films", Fizika A, vol. 15, no. 1, pp. 35-50, 2006. [Online]. Available at: https://urn.nsk.hr/urn:nbn:hr:217:428918. [Accessed: 08 March 2025]