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On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films
Fizika A, 15 (2006), 1; 35-50. urn:nbn:hr:217:428918


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Đerđ, I., Tonejc, A., Tonejc, A. & Radić, N. (2006). On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A, 15. (1), 35-50. Retrieved from https://urn.nsk.hr/urn:nbn:hr:217:428918

Đerđ, Igor, et al. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A, vol. 15, no. 1, 2006, pp. 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918

Đerđ, Igor, Anđelka Tonejc, Antun Tonejc and Nikola Radić. "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films." Fizika A 15, no. 1 (2006): 35-50. https://urn.nsk.hr/urn:nbn:hr:217:428918

Đerđ, I., et al. (2006) 'On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films', Fizika A, 15(1), pp. 35-50. Available at: https://urn.nsk.hr/urn:nbn:hr:217:428918 (Accessed 17 June 2024)

Đerđ I, Tonejc A, Tonejc A, Radić N. On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films. Fizika A [Internet]. 2006 [cited 2024 June 17];15(1):35-50. Available at: https://urn.nsk.hr/urn:nbn:hr:217:428918

I. Đerđ, A. Tonejc, A. Tonejc and N. Radić, "On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films", Fizika A, vol. 15, no. 1, pp. 35-50, 2006. [Online]. Available at: https://urn.nsk.hr/urn:nbn:hr:217:428918. [Accessed: 17 June 2024]