Žilak, J. (2017). Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology (Doctoral thesis). Zagreb: University of Zagreb, Faculty of Electrical Engineering and Computing. Retrieved from https://urn.nsk.hr/urn:nbn:hr:168:980460
Žilak, Josip. "Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology." Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, 2017. https://urn.nsk.hr/urn:nbn:hr:168:980460
Žilak, Josip. "Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology." Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, 2017. https://urn.nsk.hr/urn:nbn:hr:168:980460
Žilak, J. (2017). 'Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology', Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, accessed 12 September 2024, https://urn.nsk.hr/urn:nbn:hr:168:980460
Žilak J. Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology [Doctoral thesis]. Zagreb: University of Zagreb, Faculty of Electrical Engineering and Computing; 2017 [cited 2024 September 12] Available at: https://urn.nsk.hr/urn:nbn:hr:168:980460
J. Žilak, "Characteristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology", Doctoral thesis, University of Zagreb, Faculty of Electrical Engineering and Computing, Zagreb, 2017. Available at: https://urn.nsk.hr/urn:nbn:hr:168:980460