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master's thesis
Mjerenje Hallovog efekta u tankim poluvodičkim filmovima
Rijeka: University of Rijeka, 2020. urn:nbn:hr:194:121906
Kovačević, Tea
University of Rijeka
Faculty of Physics

Institutional repository: Repository of the University of Rijeka, Faculty of Physics

Cite this document

Kovačević, T. (2020). Mjerenje Hallovog efekta u tankim poluvodičkim filmovima (Master's thesis). Rijeka: University of Rijeka. Retrieved from https://urn.nsk.hr/urn:nbn:hr:194:121906

Kovačević, Tea. "Mjerenje Hallovog efekta u tankim poluvodičkim filmovima." Master's thesis, University of Rijeka, 2020. https://urn.nsk.hr/urn:nbn:hr:194:121906

Kovačević, Tea. "Mjerenje Hallovog efekta u tankim poluvodičkim filmovima." Master's thesis, University of Rijeka, 2020. https://urn.nsk.hr/urn:nbn:hr:194:121906

Kovačević, T. (2020). 'Mjerenje Hallovog efekta u tankim poluvodičkim filmovima', Master's thesis, University of Rijeka, accessed 16 May 2024, https://urn.nsk.hr/urn:nbn:hr:194:121906

Kovačević T. Mjerenje Hallovog efekta u tankim poluvodičkim filmovima [Master's thesis]. Rijeka: University of Rijeka; 2020 [cited 2024 May 16] Available at: https://urn.nsk.hr/urn:nbn:hr:194:121906

T. Kovačević, "Mjerenje Hallovog efekta u tankim poluvodičkim filmovima", Master's thesis, University of Rijeka, Rijeka, 2020. Available at: https://urn.nsk.hr/urn:nbn:hr:194:121906

Metadata
TitleMjerenje Hallovog efekta u tankim poluvodičkim filmovima
Title (english)Measurements of the Hall Effect in thin Semiconductor Films
AuthorTea Kovačević
MentorAleš Omerzu (mentor)
Committee memberIvana Jelovica Badovinac (predsjednik povjerenstva)
Committee memberAleš Omerzu (član povjerenstva)
Committee memberRobert Peter (član povjerenstva)
GranterUniversity of Rijeka
(Faculty of Physics)
Rijeka
Defense date and country2020-09-23, Croatia
Scientific / art field,
discipline and subdiscipline		NATURAL SCIENCES
Physics
Abstract
U ovom radu provedeno je istraživanje na tankim filmovima bakra pripremljenim na podlozi od mikroskopskog stakla, a koji su naprašivani pomoću uređaja PESC II. Tanki slojevi bakrovog oksida dobiveni su termičkom oksidacijom na temperaturama od 200 °C do 400 °C u cijevnoj peći te su pripremljeni za optička i električna mjerenja. UV-VIS spektrofotometrom izmjerena je optička transmisija i koeficijent apsorpcije tankih filmova bakrovog oksida te je određena širina poluvodičkog zabranjenog pojasa. Pomoću strujno-naponske karakteristike izračunata je električna provodnost, otpornost i otpor, a mjerenjem Hallovog napona utvrđeno je da je Cu2O p-tip poluvodiča.
Abstract (english)
In this paper, I present a study that was performed on thin copper films prepared on a microscope glass substrate, which were sputtered using a PESC II instrument. Thin layers of copper oxide were obtained by thermal oxidation at temperatures from 200 °C to 400 °C in a tube furnace and were prepared for optical and electrical measurements. The optical transmission and the absorption coefficient of thin films made of copper oxide were measured with a UV-VIS spectrophotometer, and the width of the semiconductor band gap was determined. The electrical conductivity, resistance and resistivity were calculated from the current-voltage characteristic, and the Hall voltage determined that Cu2O is a p-type semiconductor.
Keywords
Keywords (english)
Languagecroatian
URN:NBNurn:nbn:hr:194:121906
Study programmeTitle: Graduate University Study of Electrical Engineering
Study programme type: university
Study level: graduate
Academic / professional title: magistar/magistra inženjerstva i fizike materijala (magistar/magistra inženjerstva i fizike materijala)
Type of resourceText
File originBorn digital
Access conditionsAccess restricted to students and staff of home institution
Terms of useLicence In copyright icon
Created on2020-10-16 11:17:13