prikaz prve stranice dokumenta Detekcija teških iona pomoću emisije sekundarnih elektrona
  Download
PDF 20.09 MB
master's thesis
Detekcija teških iona pomoću emisije sekundarnih elektrona
Zagreb: University of Zagreb, Faculty of Science, 2017. urn:nbn:hr:217:235853
Retkovac Šešelja, Ivana
University of Zagreb
Faculty of Science
Department of Physics

Institutional repository: Repository of the Faculty of Science

Cite this document

Retkovac Šešelja, I. (2017). Detekcija teških iona pomoću emisije sekundarnih elektrona (Master's thesis). Zagreb: University of Zagreb, Faculty of Science. Retrieved from https://urn.nsk.hr/urn:nbn:hr:217:235853

Retkovac Šešelja, Ivana. "Detekcija teških iona pomoću emisije sekundarnih elektrona." Master's thesis, University of Zagreb, Faculty of Science, 2017. https://urn.nsk.hr/urn:nbn:hr:217:235853

Retkovac Šešelja, Ivana. "Detekcija teških iona pomoću emisije sekundarnih elektrona." Master's thesis, University of Zagreb, Faculty of Science, 2017. https://urn.nsk.hr/urn:nbn:hr:217:235853

Retkovac Šešelja, I. (2017). 'Detekcija teških iona pomoću emisije sekundarnih elektrona', Master's thesis, University of Zagreb, Faculty of Science, accessed 18 November 2024, https://urn.nsk.hr/urn:nbn:hr:217:235853

Retkovac Šešelja I. Detekcija teških iona pomoću emisije sekundarnih elektrona [Master's thesis]. Zagreb: University of Zagreb, Faculty of Science; 2017 [cited 2024 November 18] Available at: https://urn.nsk.hr/urn:nbn:hr:217:235853

I. Retkovac Šešelja, "Detekcija teških iona pomoću emisije sekundarnih elektrona", Master's thesis, University of Zagreb, Faculty of Science, Zagreb, 2017. Available at: https://urn.nsk.hr/urn:nbn:hr:217:235853

Metadata
TitleDetekcija teških iona pomoću emisije sekundarnih elektrona
Title (english)Heavy-ion detection by secondary electron emission
AuthorIvana Retkovac Šešelja
MentorMilko Jakšić (mentor)
MentorDamir Bosnar (mentor)
Committee memberDamir Bosnar (predsjednik povjerenstva)
Committee memberMilko Jakšić (član povjerenstva)
Committee memberTomislav Marketin (član povjerenstva)
Committee memberDenis Sunko (član povjerenstva)
Committee memberMatko Milin (član povjerenstva)
GranterUniversity of Zagreb
Faculty of Science
(Department of Physics)
Zagreb
Defense date and country2017-10-05, Croatia
Scientific / art field,
discipline and subdiscipline		NATURAL SCIENCES
Physics
Abstract
Detekcija teških iona pomoću emisije sekundarnih elektrona je od iznimne važnosti kod preciznih implantacija teških iona u materiju ili kod proizvodnje nanorupa u raznim polimerima. U ovom radu je napravljen eksperimentalni postav s dva elektronmultiplikatora ispred mete te jednim silicijskim detektorom iza mete. Korištene su četiri mete: zlato, dijamant, mylar i silicij-nitrid. Napravljena je iscrpna kalibracija sustava prije nego što su izmjerene efikasnosti detekcije sekundarnih elektrona za četiri različita snopa: Li+(E=1MeV), H+(E=2MeV) , He3+(E=4MeV) i O+(E=4MeV). Efikasnost ovakvog postava nije dobra za polimere kao što je mylar te keramike kao što je silicij-nitrid. Mjerenja su neprecizna zbog njihove strukture te je broj sekundarnih elektrona po ionu emitiranih iz tih materijala manji nego što je to slučaj kod zlata ili dijamanta. Kod ciljanoga istraživanja jedne mete ova metoda bi bila znatno bolje jer bi se tada mogla postići savršena simetrija. Također je primijećeno da je postav izuzetno osjetljiv na geometriju i simetričnost između dva detektora. Te očekivano je potvrđeno da za veću zaustavnu energiju se emitira više sekundarnih elektrona.
Abstract (english)
Detection of heavy ions by secondary electron emission is of great importance in precise implantation of ions in matter or in nanoholes production in different polymers. In this paper an experimental setup was made with two channeltrons (electron multiplier) in front of the target and one silicon detector behind the target. Four targets were used: gold, diamond, mylar and silicon-nitride. Before the measurements were made the efficiency tests were performed. The efficiency of secondary electron detection was made on four targets with four different blocks: E = 4MeV (E = 1MeV), H+(E = 1MeV) and O+ (E = 4MeV). The efficiency of this setup is not good for polymers such as well as for ceramics such as siliconnitride. The measurements are imprecise due to their structure and the number of secondary electrons emitted per ion impacted on such material is lower than that of gold or diamond. Using one specific target would give significantly better results because perfect symmetry could then be achieved. It is also noticeable that the setting is extremely sensitive to geometry and symmetry between the two detectors. As expected, it was confirmed that greater the stopping power is the number of secondary electrons emitted is greater.
Keywords
Keywords (english)
Languagecroatian
URN:NBNurn:nbn:hr:217:235853
Study programmeTitle: Physics; specializations in: Research
Course: Research
Study programme type: university
Study level: integrated undergraduate and graduate
Academic / professional title: magistar/magistra fizike (magistar/magistra fizike)
Type of resourceText
File originBorn digital
Access conditionsOpen access
Terms of useLicence In copyright icon
Created on2017-10-11 10:33:49