The paper firstly explains the term surface roughness and describes 2D parameters of roughness, especially those that were calibrated in the experimental part of the project. After that, the measuring stylus devices are described; their general configuration and the ways to guide the probe. Mistakes that may occur when measuring with stylus device are listed. A Perthometer S8P measuring device was especially described because it was used for measurements in the experimental part of the project. The standards used for calibration of the stylus device are described. They are defined by the norm ISO 5436-1:2000 Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures. Every standard has its own application for calibration of different roughness parameters. There are also desribed some of the shortcomings of currently used standards and how these disadvantages affect the calibration of the measuring range of the device. The concepts of static and dynamic mode of operation of the measuring device are explained. A proposition for the possibility of extending the standard base by using the piezo element is presented. The piezo element, its mode of operation and its movement control, which is provided by the software, are described. There is also a desription of general configuration of the device and the piezo element and their mutual interaction which results in simulated profiles. The last chapter explains how calibration is performed by using a piezo element. The chapter is divided into two parts; dynamic mode and static mode. In the dynamic mode, simulated profiles of rectangular and triangular geometry were measured, while in the static mode the depth of the simulated profile was measured. Parameters which were used to simulate the profile and to adjust the measuring device are listed. Measurements were performed according to the defined parameters and the obtained results were commented.