Skup podataka: yield_data.zip, 3.24 MB Pravo pristupa: Otvoren pristup Opis datoteke: calibrated mass spectra of phthalocyanine blue for different primary ions; files are in ascii format; the first column is mass in dalton, the second is number of counts; names of the files are in format: primary ion type + charge state + energy (engleski)
Brajković, M., Siketić, Z., Bogdanović Radović, I. i Barac, M. (2021). Dependence of MeV TOF SIMS secondary molecular ion yield from phthalocyanine blue on primary ion stopping power [Skup podataka]. doi:10.5281/zenodo.5970586
Brajković, Marko, et al. Dependence of MeV TOF SIMS secondary molecular ion yield from phthalocyanine blue on primary ion stopping power. Institut Ruđer Bošković, 2021. 12.09.2024. doi:10.5281/zenodo.5970586
Brajković, Marko, Zdravko Siketić, Ivančica Bogdanović Radović, i Marko Barac. 2021. Dependence of MeV TOF SIMS secondary molecular ion yield from phthalocyanine blue on primary ion stopping power. Institut Ruđer Bošković. doi:10.5281/zenodo.5970586
Brajković, M., et al. 2021. Dependence of MeV TOF SIMS secondary molecular ion yield from phthalocyanine blue on primary ion stopping power. Institut Ruđer Bošković. [Online]. [Citirano 12.09.2024.]. Preuzeto s: https://doi.org/10.5281/zenodo.5970586
Brajković M, Siketić Z, Bogdanović Radović I, Barac M. Dependence of MeV TOF SIMS secondary molecular ion yield from phthalocyanine blue on primary ion stopping power. [Internet]. Institut Ruđer Bošković; 2021, [pristupljeno 12.09.2024.] Dostupno na: https://doi.org/10.5281/zenodo.5970586
M. Brajković, Z. Siketić, I. Bogdanović Radović i M. Barac, Dependence of MeV TOF SIMS secondary molecular ion yield from phthalocyanine blue on primary ion stopping power, Institut Ruđer Bošković, 2021. Citirano: 12.09.2024. Dostupno na: https://doi.org/10.5281/zenodo.5970586
Naslov (engleski)
Dependence of MeV TOF SIMS secondary molecular ion yield from phthalocyanine blue on primary ion stopping power
Autor
Marko Brajković Institut Ruđer Bošković Ruđer Bošković Institute
Autor
Zdravko Siketić Institut Ruđer Bošković Ruđer Bošković Institute
Marko Barac Institut Ruđer Bošković Ruđer Bošković Institute
Znanstveno / umjetničko područje, polje i grana
PRIRODNE ZNANOSTI Fizika Nuklearna fizika
Sažetak (engleski)
Time-of-flight Secondary Ion Mass Spectrometry (TOF SIMS) is a well-established mass spectrometry technique used for the chemical analysis of both organic and inorganic materials. In the last ten years, many advances have been made to improve the yield of secondary molecular ions, especially those desorbed from the surfaces of organic samples. For that, cluster ion beams with keV energies for the excitation were mostly used. Alternatively, single-ion beams with MeV energies can be applied, as done in the present work. It is well known that secondary molecular/ion yield depends strongly on the primary ion stopping power, but the nature of this dependence is not completely clear. Therefore, in the present work secondary ion yield from the phthalocyanine blue (C32H16CuN8, organic pigment) was measured for the various combinations of ion masses, energies and charge states. Measured values were compared with the existing models for ion sputtering. An increase of the secondary yield with the primary ion energy, electronic stopping, velocity and charge state was found for different types of primary ions. Although this general behavior is valid for all primary ions, there is no single parameter that can describe the measured results for all primary ions at once.
Šifra: 824096 Naziv (engleski): Research And Development with Ion Beams – Advancing Technology in Europe-RADIATE
Projekt
Šifra: IP-2016-06-1698 Naziv (hrvatski): Razvoj kapilarne mikroprobe za MeV SIMS s primjenom na analizu bioloških materijala-BioCapSIMS Voditelj: Ivančica Bogdanović Radović